The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Oct. 17, 2017
International Business Machines Corporation, Armonk, NY (US);
Jing Chang Huang, Shanghai, CN;
Wei Sun, Beijing, CN;
Jun Chi Yan, Shanghai, CN;
Ren Jie Yao, Beijing, CN;
Jun Zhu, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for object defect detection includes receiving digital data representing an image of an object with a repeated pattern. The method identifies a part of the image of the object as defined by a sample window of the digital data. The method generates one or more functions from at least the part of the image, wherein each of the one or more functions corresponds to one component of a pixel contained in the part of the image. Responsive to performing self-similarity analytics on the one or more functions, the method identifies a defect area of the object.