The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Jan. 15, 2019
International Business Machines Corporation, Armonk, NY (US);
Guo Qiang Hu, Shanghai, CN;
Jun Chi Yan, Shanghai, CN;
Jun Zhu, Shanghai, CN;
Jing Chang Huang, Shanghai, CN;
Peng Ji, Nanjing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Embodiments of the present invention facilitate product defect detection. A computer-implemented method comprises: receiving, by a device operatively coupled to one or more processors, a template image of a normal product; generating, by the device, one or more geometric training parameters for transforming the template image; and transforming, by the device, the template image using the one or more geometric training parameters to generate a transformed image for training a data model, wherein the trained data model being used for aligning the template image and an image under inspection of a product.