Foster City, CA, United States of America

Juan C Ivaldi

This inventor holds 3 USPTO granted patents. Top assignees: The Perkin-Elmer Corporation, Sd Acquisition Inc.. Active years: 1994-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juan C Ivaldi. Retrieved from https://idiyas.com/inventor/juan-c-ivaldi-yh7grlk9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.1

ph-index = 3

Forward Citations = 161(Granted Patents)


Location History:

  • Bridgeport, CT (US) (1994)
  • Foster City, CA (US) (2000 - 2002)

Company Filing History:


Years Active: 1994-2002

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3 patents (USPTO):Explore Patents

Title: Innovations of Juan C Ivaldi

Introduction

Juan C Ivaldi is a notable inventor based in Foster City, CA (US). He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on improving processes in semiconductor circuit fabrication, showcasing his expertise and innovative spirit.

Latest Patents

One of his latest patents is titled "Method and system for identifying etch end points in semiconductor circuit fabrication." This invention discloses a spectrometer system with unique wavelength resolution that enhances the relative positioning of the diffraction grating and detector. Additionally, it introduces a modified evolving windowed factor analysis-based method for detecting semiconductor etch end points, which is particularly well-suited for real-time monitoring and process control. The use of wavelength group selecting mask filters is also a key feature of this patent.

Another significant patent is related to "Analyzing spectrometric data." This spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard and compared to a zero position to obtain first offset data. Similar data acquisition occurs at a second time to obtain second offset data. The offset data are utilized to determine a spectral shift for any subarray position at any selected time. This shift is then applied to a matrix model used for converting test data to compositional information.

Career Highlights

Throughout his career, Juan C Ivaldi has worked with prominent companies, including PerkinElmer Corporation and SD Acquisition Inc. His experience in these organizations has contributed to his development as an inventor and has allowed him to refine his skills in semiconductor technology.

Collaborations

Juan has collaborated with notable professionals in his field, including David H Tracy and Robert A Hoult. These collaborations have likely enriched his work and contributed to the advancements in his patents.

Conclusion

Juan C Ivaldi's innovative contributions to semiconductor technology demonstrate his expertise and commitment to advancing the field. His patents reflect a deep understanding of complex processes and a drive to improve efficiency in semiconductor fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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