Joseph S Fragala

Title: The Innovations of Joseph S. Fragala: Advancements in Metrology and X-ray Detection

Introduction

Joseph S. Fragala is a distinguished inventor based in Camarillo, California. With a strong focus on metrology and x-ray technology, he has been granted two patents that significantly impact surface analysis instruments and x-ray detectors. His work has contributed to advancements in precision measurement and imaging technologies.

Latest Patents

Joseph Fragala's latest inventions include the following patents:

1. **Metrology Probe with Built-In Angle and Method of Fabrication Thereof**: This invention introduces a method for batch-fabricating an array of probe devices specifically designed for surface analysis instruments, such as atomic force microscopes (AFM). The method involves providing a wafer, and photolithographically forming a base and a cantilever for each probe. Notably, the cantilever includes a built-in angle, θ, relative to the base, ensuring that the base remains substantially parallel to a sample holder when mounted in the probe holder of the instrument.

2. **Silicon Nitride X-ray Window and Method of Manufacture for X-ray Detector Use**: This innovative method outlines the production process of a radiation window. It begins with patterning a photo resist structure onto a double-sided silicon wafer, followed by plasma etching to create an etched silicon wafer with a silicon supporting structure. A silicon nitride thin film is then applied, and further processes involve patterning and wet etching to release the silicon nitride thin film and supporting structure, culminating in the creation of an initial window in the silicon nitride.

Career Highlights

Joseph S. Fragala is affiliated with Bruker Nano GmbH, a company known for its cutting-edge technologies in nanotechnology and materials science. His work at Bruker Nano emphasizes the importance of precise metrology and advanced detection systems, making significant contributions to the field.

Collaborations

Throughout his career, Joseph has collaborated with notable colleagues, including Xing Zhao and Jeffrey Wong. These collaborations underscore the importance of teamwork in fostering innovation and advancing technological developments within the field.

Conclusion

Joseph S. Fragala's contributions to the fields of metrology and x-ray detection illustrate his commitment to innovation and excellence. With his two patents reflecting significant advancements, he continues to play a vital role in shaping the future of surface analysis technologies. His work not only enhances the capabilities of instruments but also paves the way for future developments in the industry.