This inventor holds 8 USPTO granted patents. Top assignees: United Technologies Corporation, Raytheon Technologies Corporation, Rtx Corporation. Active years: 1994-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- New Britain, CT (US) (1994 - 1996)
- Avon, CT (US) (2018 - 2024)
Company Filing History:


Years Active: 1994-2026
Title: Joseph A. Sylvestro: Innovator in Robotic Inspection Technologies
Introduction
Joseph A. Sylvestro is a notable inventor based in Avon, Connecticut, with a remarkable portfolio of seven patents. His work primarily focuses on advancements in robotic inspection technologies, contributing significantly to the field of automated component inspection.
Latest Patents
Among his latest patents is a "System and method for robotic inspection." This innovative method involves supporting a part with a robotic mechanism, obtaining part-related sensor input, and controlling the robot's movement based on feedback from the sensor. Another significant patent is the "System and method for determining part damage." This process includes calibrating an imaging device and a coordinate measuring machine, acquiring images of components, and applying a damage detection algorithm to determine any damage present.
Career Highlights
Joseph has had a distinguished career, working with prominent companies such as United Technologies Corporation and Raytheon Technologies Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in robotic inspection.
Collaborations
Throughout his career, Joseph has collaborated with talented individuals, including Alan Matthew Finn and Jose Miguel Pasini. These collaborations have likely contributed to the success of his inventions and patents.
Conclusion
Joseph A. Sylvestro's contributions to robotic inspection technologies highlight his innovative spirit and dedication to advancing automated inspection processes. His patents reflect a commitment to improving efficiency and accuracy in component inspection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile