The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Dec. 05, 2018
United Technologies Corporation, Farmington, CT (US);
Alan Matthew Finn, Chapel Hill, NC (US);
Jose Miguel Pasini, Avon, CT (US);
Edgar A. Bernal, Webster, NY (US);
Ozgur Erdinc, Mansfield, CT (US);
Ziyou Xiong, Wethersfield, CT (US);
Gene B. Donskoy, Farmington, CT (US);
Sergio S. Frutuoso, Avon, CT (US);
Joseph A. Sylvestro, Avon, CT (US);
Richard W. Osborne, III, Stafford Springs, CT (US);
Olusegun T. Oshin, Manchester, CT (US);
William L. Rall, Fort Worth, TX (US);
Raytheon Technologies Corporation, Farmington, CT (US);
Abstract
A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.