Company Filing History:
2 out of 5 
1 out of 11,326 
1 out of 297 
Years Active: 2002-2011
Title: Joong Whan Lee: Innovator in Optical Measurement Technologies
Introduction
Joong Whan Lee is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of optical measurement technologies, holding a total of 3 patents. His work focuses on advancing the methods used to analyze the optical properties of materials.
Latest Patents
One of his latest inventions is a focused-beam ellipsometer. This ellipsometer is designed to determine the optical properties of a sample by analyzing the variation of the polarization of light that is reflected off the surface of the sample. Another notable patent is an apparatus for measuring the characteristics of thin films using a two-dimensional detector. This non-contact, non-destructive measuring apparatus assesses the thickness profile and refractive index distribution of single or multiple layers of thin films. It employs multiple narrow band-pass optical filters and a two-dimensional array of CCD sensors to achieve accurate measurements.
Career Highlights
Throughout his career, Joong Whan Lee has worked with notable organizations such as K-MAC and the Electronics and Telecommunications Research Institute. His experience in these institutions has allowed him to refine his skills and contribute to innovative projects in optical measurement.
Collaborations
Joong Whan Lee has collaborated with several professionals in his field, including Yeong Ryeol Kim and Ji Jong Park. These collaborations have further enhanced his research and development efforts.
Conclusion
Joong Whan Lee's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in analyzing optical properties, making him a valuable figure in his field.