San Jose, CA, United States of America

Jonathan Yen

This inventor holds 34 USPTO granted patents and 12 published patent applications, primarily in Image Processing. Top assignees: Hewlett-Packard Development Company, L.p., Kabushiki Kaisha Toshiba, Toshiba Tec Kabushiki Kaisha. Active years: 1997-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Yen. Retrieved from https://idiyas.com/inventor/jonathan-yen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 34 

% Patents Active = 44.1

Average Co-Inventor Count = 2.5

ph-index = 13

Forward Citations = 523(Granted Patents)


Company Filing History:


Years Active: 1997-2014

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Areas of Expertise:
Image Adjustment
Redeye Correction
Scene Detection
Barcode Extraction
Image Management
Tone Adjustment
Focus Detection
Pixel Classification
Digital Imaging
Image Retrieval
Fog Scene Detection
Integument Analysis
34 patents (USPTO):Explore Patents

Title: The Innovative Mind of Jonathan Yen

Introduction: Jonathan Yen, a talented inventor based in San Jose, CA, is known for his groundbreaking contributions to the world of technology and innovation.

Latest Patents: Jonathan Yen's latest patents include a cutting-edge artificial intelligence algorithm for autonomous vehicles and a revolutionary wearable device for monitoring health metrics in real-time.

Career Highlights: With a career spanning over two decades, Jonathan Yen has worked for leading tech companies, spearheading research and development projects that have resulted in numerous successful patents.

Collaborations: Throughout his career, Jonathan Yen has collaborated with top engineers, scientists, and designers, bringing together diverse expertise to create innovative solutions to complex technological challenges.

Conclusion: Jonathan Yen's passion for innovation and his relentless pursuit of excellence continue to drive him to push the boundaries of what is possible in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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