The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Aug. 18, 2008
Jonathan Yen, San Jose, CA (US);
Tony Quach, Anaheim, CA (US);
Jonathan Yen, San Jose, CA (US);
Tony Quach, Anaheim, CA (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Tec Kabushiki Kaisha, Tokyo, JP;
Abstract
The subject application is directed to a system and method for validation of face detection in electronic images. Image data is first received along with at least one image portion that includes a possible facial depiction. Eye position data, nose position data, and mouth position data are also received. A reference point at a central location of the at least one image portion is then isolated. A width of the image portion is then isolated, and a facial region is isolated in accordance with the eye, nose, and mouth position data. The eye distance is then determined from the received eye position data. The isolated facial region data is then tested against the reference point and eye distance is tested against a width of the image portion. An output is generated corresponding to the accuracy of isolated facial region in accordance with the tests.