This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Bruker Nano Gmbh, General Electric Company. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2026
Title: Innovations by Jonathan Rutherford Owens
Introduction
Jonathan Rutherford Owens is an accomplished inventor based in Glenville, NY (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent that enhances the inspection process of various components.
Latest Patents
Owens holds a patent for an "Inspection apparatus and method for inspecting a component." This invention features a sophisticated inspection apparatus that includes a robotic arm and a micro-XRF instrument. The instrument head is coupled to the robotic arm, allowing for precise inspections. The apparatus also includes a seat that supports the component within a designated scanning area during inspection, along with a computer that communicates with both the robotic arm and the micro-XRF instrument. This technology represents a significant advancement in the field of component inspection.
Career Highlights
Throughout his career, Jonathan Owens has worked with notable companies, including General Electric Company and Bruker Nano GmbH. His experience in these organizations has contributed to his expertise in the development of innovative inspection technologies.
Collaborations
Some of his notable coworkers include Walter Vincent Dixon, III and Michael Christopher Andersen. Their collaboration has likely played a role in the advancement of Owens' inventions and patents.
Conclusion
Jonathan Rutherford Owens is a prominent inventor whose work in inspection technology has led to valuable innovations. His patent for an inspection apparatus showcases his commitment to improving component inspection processes. His contributions to the field continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile