The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Nov. 10, 2023
General Electric Company, Schenectady, NY (US);
Bruker Nano Gmbh, Berlin, DE;
Richard Didomizio, Charlton, NY (US);
Michael Christopher Andersen, Cincinnati, OH (US);
Walter Vincent Dixon, III, Delanson, NY (US);
Timothy Hanlon, Glenmont, NY (US);
Wayne Lee Lawrence, Sardinia, OH (US);
Ramkumar Kashyap Oruganti, Bangalore, IN;
Jonathan Rutherford Owens, Glenville, NY (US);
Daniel M. Ruscitto, Niskayuna, NY (US);
Adarsh Shukla, Bangalore, IN;
Eric John Telfeyan, Delanson, NY (US);
Gregory Donald Crim, Middletown, OH (US);
Michael Wylie Krauss, Cincinnati, OH (US);
André Dziurla, Berlin, DE;
Sven Martin Joachim Larisch, Berlin, DE;
Falk Reinhardt, Berlin, DE;
Roald Alberto Tagle Berdan, Berlin, DE;
Henning Schroeder, Berlin, DE;
General Electric Company, Evendale, OH (US);
Bruker Nano GmbH, Berlin, DE;
Abstract
An apparatus and method for an inspection apparatus for inspecting a component. The inspection apparatus including a robotic arm. A micro-XRF instrument having an instrument head coupled to the robotic arm. A seat supporting the component within a scanning area during inspection; and a computer in communication with the robotic arm and the micro-XRF instrument.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile