This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignees: Bruker Nano Gmbh, General Electric Company. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2026
Title: Adarsh Shukla: Innovator in Inspection Technology
Introduction
Adarsh Shukla is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work reflects a commitment to advancing the capabilities of inspection apparatuses.
Latest Patents
Adarsh holds a patent for an "Inspection apparatus and method for inspecting a component." This invention features a sophisticated apparatus that includes a robotic arm and a micro-XRF instrument. The instrument head is coupled to the robotic arm, allowing for precise inspections. The design also incorporates a seat that supports the component within a scanning area during inspection, along with a computer that communicates with both the robotic arm and the micro-XRF instrument. This patent showcases his ingenuity and technical expertise in developing advanced inspection solutions. He has 1 patent to his name.
Career Highlights
Throughout his career, Adarsh has worked with prominent companies, including General Electric Company and Bruker Nano GmbH. His experience in these organizations has allowed him to hone his skills and contribute to various innovative projects.
Collaborations
Adarsh has collaborated with notable professionals in his field, including André Dziurla and Walter Vincent Dixon III. These collaborations have further enriched his work and expanded his impact in the industry.
Conclusion
Adarsh Shukla is a distinguished inventor whose work in inspection technology has made a significant mark. His innovative patent and experience with leading companies highlight his contributions to the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile