This inventor holds 1 USPTO granted patent. Top assignees: Bruker Nano Gmbh, General Electric Company. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2026
Title: Gregory Donald Crim: Innovator in Inspection Technology
Introduction
Gregory Donald Crim is a notable inventor based in Middletown, OH (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work has been recognized in various industries, showcasing his expertise and dedication to advancing technology.
Latest Patents
One of Gregory Donald Crim's key patents is titled "Inspection apparatus and method for inspecting a component." This invention features an inspection apparatus that includes a robotic arm and a micro-XRF instrument. The instrument head is coupled to the robotic arm, allowing for precise inspections. The apparatus also includes a seat that supports the component within a scanning area during inspection, along with a computer that communicates with both the robotic arm and the micro-XRF instrument. This patent highlights his commitment to improving inspection processes through innovative technology.
Career Highlights
Throughout his career, Gregory has worked with prominent companies such as General Electric Company and Bruker Nano GmbH. His experience in these organizations has allowed him to develop and refine his skills in the field of inspection technology. His contributions have had a lasting impact on the industry, demonstrating his ability to innovate and lead in his area of expertise.
Collaborations
Gregory has collaborated with talented individuals in his field, including Sven Martin Joachim Larisch and Henning Schroeder. These partnerships have further enhanced his work and contributed to the development of advanced inspection technologies.
Conclusion
Gregory Donald Crim is a distinguished inventor whose work in inspection technology has made a significant impact. His innovative patent and career achievements reflect his dedication to advancing the field. His contributions continue to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile