This inventor holds 4 USPTO granted patents and 10 published patent applications. Top assignee: Dell Products Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Jonathan Mendes De Almeida
Introduction
Jonathan Mendes De Almeida is an accomplished inventor based in Brasília, Brazil. He has made significant contributions to the field of anomaly detection through his innovative patent. His work focuses on developing frameworks that enhance the understanding and explanation of data anomalies.
Latest Patents
Jonathan holds a patent titled "Framework for selecting thresholds for anomaly detection models and generating quantitative explanations." This patent discloses a framework for extracting quantitative and comparable explanations in terms of feature-value ranges for anomaly detection models based on outlier scores. The process involves three phases: first, computing outlier scores for a data set; second, extracting thresholds per feature to identify abnormal entries; and third, generating a map between feature-outlier scores and feature-value ranges, which represent explanations. This innovative approach allows for the extraction of quantitative metrics to explain a model effectively.
Career Highlights
Jonathan is currently employed at Dell Products Inc., where he applies his expertise in data analysis and anomaly detection. His work at Dell has allowed him to contribute to the development of advanced technologies that improve data processing and analysis.
Collaborations
Jonathan has collaborated with notable colleagues, including Helen Cristina De Mattos Senefonte and Alexander Eulalio Robles Robles. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Jonathan Mendes De Almeida is a prominent inventor whose work in anomaly detection has the potential to significantly impact data analysis methodologies. His innovative patent and collaborations highlight his commitment to advancing technology in this field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
