The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Oct. 25, 2023
Dell Products L.p., Round Rock, TX (US);
Adriana Bechara Prado, Niterói, BR;
Alexander Eulalio Robles Robles, Valinhos, BR;
Eduarda Tatiane Caetano Chagas, Belo Horizonte, BR;
Helen Cristina De Mattos Senefonte, Londrina, BR;
Jonathan Mendes De Almeida, Brasília, BR;
Karen Stéfany Martins, Belo Horizonte, BR;
Dell Products L.P., Round Rock, TX (US);
Abstract
A framework for extracting quantitative and comparable explanations in terms of feature-value ranges for anomaly detection models based on outlier scores is disclosed. In a first phase, outlier scores are computed for a data set. In a second phase, thresholds per feature, which are used to identify abnormal entries or records in the data set, are extracted. In a third phase, a map between feature-outlier scores and feature-value ranges is generated. The feature-value ranges represent explanations. The explanations may include extracting quantitative metrics to explain a model.