The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Apr. 16, 2024
Dell Products L.p., Round Rock, TX (US);
Adriana Bechara Prado, Niterói, BR;
Alexander Eulalio Robles Robles, Valinhos, BR;
Eduarda Tatiane Caetano Chagas, Maceió, BR;
Helen Cristina De Mattos Senefonte, Londrina, BR;
Jonathan Mendes De Almeida, Brasília, BR;
Karen Stefany Martins, Belo Horizonte, BR;
Dell Products L.P., Round Rock, TX (US);
Abstract
Techniques for classifying anomalies are disclosed. Data sets are collected. Anomalies are identified within those data sets. Explanations are generated for those anomalies. A central table is created, and this central table lists multiple conjugation of feature ranges described in the explanations. A pattern mining algorithm is applied to the central table. The pattern mining algorithm is tasked with identifying whether the second conjugation of feature ranges corresponds with the first conjugation of feature ranges. A determination is made that the second conjugation of feature ranges does correspond with the first conjugation of feature ranges. The anomalies are flagged as being global anomalies.