Jonathan Cohen

Title: The Innovative Contributions of Jonathan Cohen

Introduction

Jonathan Cohen is an accomplished inventor based in Flanders, NJ (US). He has made significant contributions to the field of acoustic metrology, particularly in the detection of voids in advanced interconnect technologies. His work has implications for the future of 3-D integration in electronics.

Latest Patents

Cohen holds a patent for "Non-destructive acoustic metrology for void detection." This innovative technology utilizes laser-based acoustic techniques to generate broadband acoustic waves that propagate through Through Silicon Vias (TSVs). An optical interferometer is employed to detect surface displacements caused by these acoustic waves, providing critical information about the structure's dimensions and any irregularities, such as voids. The method allows for quick measurements, typically taking only a few seconds per site, making it suitable for in-line process monitoring.

Career Highlights

Throughout his career, Jonathan Cohen has worked with notable organizations, including Rudolph Technologies, Inc. and the University of Colorado. His experience in these institutions has allowed him to refine his expertise in acoustic metrology and contribute to advancements in the field.

Collaborations

Cohen has collaborated with esteemed colleagues such as Manjusha Mehendale and Michael Kotelyanskii. Their combined efforts have furthered the development of innovative technologies in the realm of acoustic metrology.

Conclusion

Jonathan Cohen's contributions to the field of acoustic metrology exemplify the importance of innovation in advancing technology. His patent and career achievements highlight his role as a key figure in the development of non-destructive testing methods for advanced interconnect technologies.