This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Onto Innovation Inc.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Innovations of Jonathan Andrew Miller
Introduction: Jonathan Andrew Miller is an accomplished inventor based in Fremont, CA (US). He has made significant contributions to the field of optical metrology, showcasing his expertise through his innovative patent.
Latest Patents: Jonathan holds a patent titled "Optical metrology with nuisance feature mitigation." This invention involves a sample that includes a target structure with a structure-of-interest (SOI) having a set of known parameters optically coupled to an unknown structure. The optical measurement is conducted using light incident on the target structure. The light detected from the target structure in response to the incident illumination is utilized to obtain metrology data, which combines information from the SOI and contributions from the unknown structure. A trained neural network is employed to determine a set of parameter values characterizing both the SOI and the unknown structure based on the metrology data. He has 1 patent to his name.
Career Highlights: Jonathan is currently associated with Onto Innovation Inc., where he continues to develop and refine his innovative ideas. His work in optical metrology has positioned him as a key player in advancing technology in this field.
Collaborations:
Conclusion: Jonathan Andrew Miller's contributions to optical metrology through his innovative patent demonstrate his commitment to advancing technology and improving measurement techniques. His work at Onto Innovation Inc. further emphasizes his role as a significant inventor in the industry.