Jon Meyer

Title: Jon Meyer: A Pioneer in Light Inspection Technologies

Introduction

Jon Meyer, an innovative inventor based in Fremont, CA, is known for his contributions to the field of optical inspection technologies. With a total of four patents to his name, he has made significant advancements that enhance the efficiency and effectiveness of specimen inspections using light.

Latest Patents

Among his latest patents is one focused on "Systems and methods for inspecting a specimen with light at varying power levels." This patent describes a system that includes a light source designed to generate light, coupled with a power attenuator subsystem that allows for the adjustment of the light's power level directed at the specimen. This system can switch between at least two power levels, enhancing the ability to detect defects on the specimen by analyzing light that has been scattered from it.

Another noteworthy patent is the "Grating based multiplexer/demultiplexer component." This patent details a demultiplexer module comprised of three integral sections, allowing for the effective routing of angularly separated light beams. The system maintains structural support and alignment, facilitating the detection of individual beams by optical detectors.

Career Highlights

Jon Meyer has had a fruitful career, having worked with reputable companies such as Opnext, Inc. and KLA-Tencor Technologies Corporation. His experience in these firms has undoubtedly contributed to his expertise in developing cutting-edge technologies within the optical field.

Collaborations

Throughout his career, Jon has collaborated with talented individuals, including his coworkers Joseph Vanniasinkam and Christopher Viray. These collaborations have played a vital role in fostering innovative ideas and advancing optical inspection methodologies.

Conclusion

Jon Meyer stands out as a prominent inventor in the realm of optical technologies. His patents and collaborations demonstrate a commitment to advancing inspection systems that leverage varying light power levels for improved defect detection. Through his work, he continues to pave the way for future innovations in specimen inspection technology.