The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2008

Filed:

Jun. 16, 2006
Applicants:

Joseph Vanniasinkam, Scarborough, CA;

Jon Meyer, Fremont, CA (US);

Christopher Viray, Sunnyvale, CA (US);

Bor-long Twu, Sunnyvale, CA (US);

Inventors:

Joseph Vanniasinkam, Scarborough, CA;

Jon Meyer, Fremont, CA (US);

Christopher Viray, Sunnyvale, CA (US);

Bor-Long Twu, Sunnyvale, CA (US);

Assignee:

Opnext, Inc., Eatontown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01); G02F 1/295 (2006.01);
U.S. Cl.
CPC ...
Abstract

A grating based demultiplexer module is described. The module includes an integrally formed first section, second section, and third section. The first section includes a diffraction grating formed on the surface of the first section and directs a WDM beam onto the internal surface of the diffraction grating. The third section is positioned to receive angularly separated light from the external surface of the diffraction grating. In some embodiments, the third section can direct individualy beams of the angularly separated light onto the surface of optical detectors. The third section provides structural support and maintains the alignment between the first section and the third section.


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