Location History:
- Cottenham, GB (2010)
- Cambridge, GB (2005 - 2019)
Company Filing History:
Years Active: 2005-2019
Title: The Innovations of John Tingay
Introduction
John Tingay is a notable inventor based in Cambridge, GB, recognized for his contributions to the field of x-ray inspection technology. With a total of six patents to his name, Tingay has made significant advancements that enhance the efficiency and effectiveness of x-ray inspection systems.
Latest Patents
One of Tingay's latest patents is an x-ray inspection apparatus that includes a cabinet containing an x-ray source, a sample support for holding the sample to be inspected, and an x-ray detector. This innovative system features an air mover designed to force air into the cabinet through an air inlet located above the sample support. The design ensures that air is directed past the sample support to an air outlet below it, optimizing the inspection process. Additionally, the sample support is equipped with a vertical positioning mechanism that allows for precise movement in a vertical direction, along with a horizontal positioning mechanism for lateral adjustments.
Another significant patent by Tingay focuses on an x-ray inspection apparatus specifically for inspecting semiconductor wafers. This system also includes a cabinet with an x-ray source, a sample support, and an x-ray detector. The air mover in this design is configured similarly to ensure effective airflow, and the cabinet is constructed to provide an x-ray shield, making it suitable for clean room environments.
Career Highlights
Throughout his career, John Tingay has worked with prominent companies such as Nordson Corporation and Leica Microsystems Lithography GmbH. His experience in these organizations has contributed to his expertise in developing advanced x-ray inspection technologies.
Collaborations
Tingay has collaborated with notable professionals in his field, including Dragos Golubovic and William T. Walker. These collaborations have likely enriched his work and led to further innovations in x-ray inspection systems.
Conclusion
John Tingay's contributions to x-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the technical requirements for effective inspection systems, making him a significant figure in the field.