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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10393675 B1

PDFFull Text
Date of Patent:
Aug. 27, 2019

Filed:

Apr. 03, 2015

X-ray inspection apparatus

Applicant:

Nordson Corporation, Westlake, OH (US);

Inventors:

John Tingay, Cambridge, GB;

William T. Walker, Suffolk, GB;

Phil King, Essex, GB;

Simon White, Suffolk, GB;

Kate Donaldson-Stewart, Essex, GB;

Assignee:

Nordson Corporation, Westlake, OH (US);

Attorney:

Baker & Hostetler LLP

Primary Examiner:

Courtney D Thomas

Int. Cl.
CPC ...
G01N 23/04 (2018.01); H01L 21/67 (2006.01); H01L 21/66 (2006.01); H01L 21/68 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); H01L 21/67288 (2013.01); H01L 21/681 (2013.01); H01L 21/6838 (2013.01); H01L 22/12 (2013.01); G01N 2223/309 (2013.01); G01N 2223/6113 (2013.01); G01N 2223/6116 (2013.01); G01N 2223/6462 (2013.01);
Abstract

An x-ray inspection system including a cabinet containing an x-ray source, a sample support for supporting a sample to be inspected, and an x-ray detector; an air mover configured to force air into the cabinet through an air inlet above the sample support, where the air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support, and an assembly for positioning the sample support relative to the x-ray source and x-ray detector. The sample support includes an upper surface extending in a horizontal plane and the sample positioning assembly includes a vertical positioning mechanism for moving the sample support in a vertical direction, orthogonal to the horizontal plane, and a first horizontal positioning mechanism for moving the sample support and vertical positioning mechanism in a first horizontal direction.

Find Patent Forward Citations

Tingay, John. (2019). X-ray inspection apparatus (U.S. Patent No. 10393675). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10393675

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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