John Schaefer

Title: John Schaefer: Innovator in Wafer Inspection Technology

Introduction

John Schaefer is a notable inventor based in Miller Place, NY (US). He has made significant contributions to the field of wafer inspection technology. His innovative approach has led to the development of a unique inspection system that enhances the accuracy and efficiency of wafer analysis.

Latest Patents

Schaefer holds a patent for a "Wafer inspection system including a laser triangulation sensor." This system incorporates a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected, while the magnification changer features a variety of selectable lenses of different magnifications. The first camera captures the line projected onto the wafer and produces three-dimensional line data that indicates the height of features on the wafer. Each lens in the magnification changer maintains the same nominal focal plane position of the first camera relative to the wafer. He has 1 patent to his name.

Career Highlights

John Schaefer is currently employed at Onto Innovation Inc., where he continues to develop cutting-edge technologies in the semiconductor industry. His work focuses on improving inspection systems that are crucial for the manufacturing of high-quality wafers.

Collaborations

Schaefer collaborates with talented individuals such as Christopher J Voges and Nicholas Smith, who contribute to the innovative projects at Onto Innovation Inc. Their teamwork fosters an environment of creativity and technological advancement.

Conclusion

John Schaefer's contributions to wafer inspection technology exemplify his dedication to innovation in the semiconductor field. His patented systems are paving the way for more precise and efficient manufacturing processes.