The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Jun. 08, 2018
Applicant:

Rudolph Technologies, Inc., Wilmington, MA (US);

Inventors:

John Schaefer, Miller Place, NY (US);

Christopher Voges, Eden Prairie, MN (US);

Nicholas Smith, Burnsville, MN (US);

Jeffrey Treptau, Lakeville, MN (US);

Assignee:

ONTO INNOVATION INC., Wilmington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G01B 11/06 (2006.01); G06T 7/00 (2017.01); G01B 11/25 (2006.01); H04N 5/232 (2006.01); H04N 5/247 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); G01B 11/2545 (2013.01); G06T 7/0004 (2013.01); G06T 7/97 (2017.01); H04N 5/2256 (2013.01); H04N 5/23296 (2013.01); H04N 5/247 (2013.01); G01B 2210/56 (2013.01); G01N 21/9501 (2013.01); G06T 2207/30148 (2013.01);
Abstract

One example of an inspection system includes a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected. The magnification changer includes a plurality of selectable lenses of different magnification. The first camera images the line projected onto the wafer and outputs three-dimensional line data indicating the height of features of the wafer. Each lens of the magnification changer provides the same nominal focal plane position of the first camera with respect to the wafer.


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