Company Filing History:
Years Active: 1993-1996
Title: John M Lindquist: Innovator in Focused Ion Beam Technology
Introduction
John M Lindquist is a notable inventor based in Portland, OR (US), recognized for his contributions to focused ion beam technology. With a total of 3 patents, Lindquist has made significant advancements in the field, particularly in image registration and chemical analysis systems.
Latest Patents
One of Lindquist's latest patents is the "Image-to-image registration focused ion beam system." This innovative system utilizes interactive computer graphic systems to align and register multiple image representations of a device from various sources, such as optical microscopic images and computer-aided design representations. The accurate alignment of these images to the focused ion beam (FIB) image allows for the detection of subsurface features that may not be visible through the FIB image alone. This capability enhances the operation of the FIB system for milling or conductor/insulator deposition. Additionally, the invention improves the counting of aluminum grains by registering images taken at different tilt angles, resulting in a more accurate representation of grain boundaries.
Another significant patent is the "Secondary ion mass spectrometry system." In this system, a focused ion beam is directed toward a sample while iodine vapor is introduced to aid in the sputtering of material. The iodine vapor, generated by heating solid iodine, enhances the conversion of neutral to ionic sputtered species, facilitating chemical analysis. This innovative approach allows for the handling of iodine in a solid state, minimizing toxic hazards and eliminating the need for external plumbing.
Career Highlights
Lindquist's career is marked by his work at Fei Company, where he has applied his expertise in focused ion beam technology. His contributions have been instrumental in advancing the capabilities of FIB systems, making them more effective for various applications.
Collaborations
Throughout his career, Lindquist has collaborated with notable colleagues, including Lynwood W Swanson and Richard J Young. These collaborations have further enriched his work and contributed to the development of innovative technologies in the field.
Conclusion
John M Lindquist stands out as a prominent inventor in the realm of focused ion beam technology. His patents reflect a commitment to enhancing imaging and analysis systems, showcasing his innovative spirit and technical expertise. His work continues to influence advancements in the field, making a lasting impact on technology and research.