This inventor holds 1 USPTO granted patent. Top assignee: Memc Electronic Materials, Inc.. Active years: 2003.
Company Filing History:
Years Active: 2003
Title: John Lhamon: Innovator in Polycrystalline Silicon Measurement
Introduction
John Lhamon is an accomplished inventor based in St. Peters, MO (US). He has made significant contributions to the field of materials science, particularly in the measurement of polycrystalline silicon. His innovative approach has led to advancements in the Czochralski silicon growing process.
Latest Patents
Lhamon holds a patent for a "Method and system for measuring polycrystalline chunk size and distribution in the charge of a Czochralski process." This patent describes a method and system for determining the size of polycrystalline silicon chunks used in the Czochralski process. The process involves arranging polycrystalline silicon chunks on a measuring background, capturing images with a camera, and using an image processor to analyze the dimensions of the chunks. A size parameter associated with the chunks is then determined, enhancing the efficiency of the silicon growing process.
Career Highlights
Lhamon is currently employed at MEMC Electronic Materials, Inc., where he applies his expertise in materials science. His work has been instrumental in improving the quality and efficiency of silicon production, which is crucial for various applications in the electronics industry.
Collaborations
Lhamon has collaborated with notable colleagues, including John D. Holder and Steven M. Joslin. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
John Lhamon's contributions to the field of polycrystalline silicon measurement exemplify the impact of innovative thinking in materials science. His patent and work at MEMC Electronic Materials, Inc. highlight his commitment to advancing technology in the silicon growing process.