The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

Oct. 15, 1999
Applicant:
Inventors:

John D. Holder, Lake St. Louis, MO (US);

Steven Joslin, St. Peters, MO (US);

Hariprasad Sreedharamurthy, Maryland Heights, MO (US);

John Lhamon, St. Peters, MO (US);

Assignee:

MEMC Electronic Materials, Inc., St. Peters, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C30B 1/500 ;
U.S. Cl.
CPC ...
C30B 1/500 ;
Abstract

A method and system for determining polycrystalline silicon chunk size for use with a Czochralski silicon growing process. Polycrystalline silicon chunks are arranged on a measuring background. A camera captures an image of the chunks. An image processor processes the image and determines the dimensions of the chunks based on the captured image. A size parameter associated with the chunks is determined.


Find Patent Forward Citations

Holder, John. (2003). Method and system for measuring polycrystalline chunk size and distribution in the charge of a czochralski process (U.S. Patent No. 6589332). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6589332

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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