South Burlington, VT, United States of America

John L Harris

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2001-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John L Harris. Retrieved from https://idiyas.com/inventor/john-l-harris-1o5h3kf7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.9

ph-index = 2

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 2001-2003

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2 patents (USPTO):Explore Patents

Title: Innovations by John L Harris

Introduction

John L Harris is an accomplished inventor based in South Burlington, Vermont. He has made significant contributions to the field of technology, particularly in optimizing testing methods for electronic components. With a total of 2 patents, his work has had a notable impact on manufacturing processes.

Latest Patents

One of his latest patents is titled "Method for test optimization using historical and actual fabrication test data." This invention provides a method and system that minimizes wafer or package level test time without adversely impacting yields in downstream manufacturing processes or degrading outgoing quality levels. The method optimizes testing by determining the most effective set of tests for a given lot or wafer. It utilizes a processor-based system that integrates multiple sources of data, including historical and real-time information from wafer fabrication, product qualification test results, and manufacturing functional test results. This comprehensive approach ensures an optimal set of tests is run, optimizing test time while minimizing risks to yield or product quality.

Another significant patent by Harris is the "Built in self test method and structure for analog to digital converter." This invention offers a method and structure for testing an A to D converter that contains a plurality of discrete components. The testing methodology involves dividing the circuit into segments for testing purposes, allowing for a comparison of the values of components across different segments. This innovative approach enhances the reliability of testing for analog to digital converters.

Career Highlights

John L Harris is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to further develop his innovative ideas and contribute to cutting-edge technology in the industry.

Collaborations

Throughout his career, Harris has collaborated with notable coworkers, including Raymond J Bulaga and Donald Lawrence Wheater. These collaborations have likely enriched his work and contributed to the success of his inventions.

Conclusion

John L Harris is a prominent inventor whose work in optimizing testing methods has made a significant impact in the technology sector. His patents reflect a deep understanding of manufacturing processes and a commitment to improving product quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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