The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2001
Filed:
Apr. 30, 1999
Raymond J. Bulaga, Richmond, VT (US);
Brooks A. Cummings, Jericho, VT (US);
Douglas R. Firth, Ithaca, NY (US);
John L. Harris, South Burlington, VT (US);
Christina L. Newman, Stowe, VT (US);
Donald L. Wheater, Hinesburg, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and structure for testing an A to D converter containing a plurality of discrete components is provided. The testing methodology includes dividing the circuit into a number of segments of the discrete components (for testing purposes only) with each segment having the same number of discrete components or an unequal but known number of discrete components. The value of the components individually and collectively of each segment is tested and compared with the value of the corresponding components of at least one other segment, and an output signal is generated of the compared value of the segments being tested. Preferably, the components are in a ladder configuration and are either resistors or capacitors. The testing of the components takes place by impressing constant voltage reference signal to at least a portion of one of the segments, sampling and holding this value and then providing a similar reference signal to complementary components of the other of said segments being compared, and comparing the output signal from each of the segments.