John Jeffrey Lyon, a prolific inventor based in San Marcos, CA, is renowned for his contributions to the field of particle detection systems. With an impressive portfolio of 8 patents, Lyon has been at the forefront of developing cutting-edge technologies that have revolutionized the way we approach light-scattering instrumentation.

Latest Patents:

One of Lyon's latest patents includes the invention of systems and methods for a multiple angle light scattering (MALS) instrument featuring a two-dimensional detector array. This innovative particle detection system utilizes a reflective optic with a curved surface to detect high angle scattered light emitted by particles in a liquid medium when exposed to a laser beam. By leveraging MIE scattering theory and Rayleigh Scattering, Lyon's invention enables the detection of scattered light over a wider range of angles than previously achievable.

Career Highlights:

Throughout his career, Lyon has made significant contributions to companies such as Hughes-JVC Technology Corporation and JMAR LLC. His expertise in developing advanced technologies for particle detection systems has led to groundbreaking innovations that have propelled the industry forward.

Collaborations:

Lyon has collaborated with esteemed professionals in the field, including coworkers Michael J Little and Thomas S Tyrie. Together, they have worked on refining light-scattering technologies and pushing the boundaries of what is possible in particle detection systems.

Conclusion:

In conclusion, John Jeffrey Lyon stands as a visionary inventor who has made indelible marks in the realm of light-scattering instrumentation. His relentless pursuit of innovation and dedication to pushing the boundaries of technology have cemented his legacy as a trailblazer in the industry.

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