The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Jan. 19, 2001
Applicant:
Inventors:

Ravi K. Verma, Pasadena, CA (US);

Michael J. Little, Oak Park, CA (US);

Thomas S. Tyrie, Oak Park, CA (US);

John J. Lyon, San Marcos, CA (US);

Ron Pollock, Van Nuys, CA (US);

Assignee:

Parvenu, Inc., Westlake Village, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A cost-effective broadband tunable Fabry-Perot interferometer uses entropic, rather than enthalpic, materials to provide the compliant support for the interferometer's movable mirror. Entropic materials exhibit an entropic plateau region over a wide frequency range with a Young's modulus much lower than enthalpic materials, linear elastic behavior over a wide deformation range, and, in certain geometries, energy and stress behavior that tend to stabilize the movable mirror during deformation. The compliant support can be configured in a variety of geometries including compression, tension, sheer and diaphragm and of a variety of materials including elastomers, aerogels or other long chained polymers.


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