This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: John Fretwell and Semiconductor Defect Detection.
Introduction
John Fretwell is an inventor associated with Fort Worth, Texas, and Kla-Tencor Technologies Corporation. His work includes a patent describing a method for detecting electrically active defects in circuitry formed on a semiconductor substrate.
Latest Patents
Fretwell is credited with 1 patent: “Detection of Defects Using Transient Contrast.” The invention describes scanning circuitry with a primary electron beam in two non-parallel directions and detecting the secondary electrons emitted during each scan. The resulting voltage-contrast images are compared to identify electrically active defects.
Career Highlights
Fretwell’s patent reflects work in semiconductor inspection and defect detection. By comparing images captured from different scan directions, the disclosed method offers an approach to identifying electrical defects in circuitry.
Collaborations
Fretwell’s listed coworkers include Robert W. Fiordalice and Kara Lee Sherman. His patent is associated with Kla-Tencor Technologies Corporation.
Conclusion
John Fretwell’s patent documents an approach to semiconductor defect detection that uses transient voltage contrast and comparisons between scans.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile