This inventor holds 2 USPTO granted patents. Top assignee: Xyletech Systems, Inc.. Active years: 1996-1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996-1998
Title: Innovations by John C. Yundt
Introduction
John C. Yundt is an accomplished inventor based in Plano, TX (US). He has made significant contributions to the field of biochemical testing through his innovative methods. With a total of 2 patents, Yundt continues to push the boundaries of technology in his area of expertise.
Latest Patents
Yundt's latest patents focus on methods for analyzing multiple range test data. The first patent describes a method for analyzing the performance of a testing device that operates over at least two ranges. This method involves obtaining a first set of test results from the device, calculating individual range means, and obtaining a second set of results from a group of devices. The process includes calculating group range means and standard deviations, ultimately allowing for a comprehensive analysis of the device's performance through a single graphic display.
The second patent also addresses the analysis of performance for testing devices, particularly hematology testing devices. It outlines a method for forming parallel data range axes and calculating standard deviation indexes based on test results. The resulting graph aids in analyzing and calibrating the testing device, ensuring accuracy and reliability in biochemical testing.
Career Highlights
John C. Yundt is currently associated with Xyletech Systems, Inc., where he applies his expertise in developing innovative testing solutions. His work has been instrumental in enhancing the performance and reliability of testing devices used in various applications.
Conclusion
John C. Yundt's contributions to the field of biochemical testing through his innovative patents demonstrate his commitment to advancing technology. His methods for analyzing test data are vital for improving the accuracy and efficiency of testing devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile