The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 1996
Filed:
May. 26, 1993
John C Yundt, Plano, TX (US);
Xyletech Systems, Inc., Plano, TX (US);
Abstract
A method and graph for analyzing the performance of a testing device that operates over at least two ranges, such as a hematology testing device. The method of the invention comprises forming generally parallel data range axes, each relating to a range of operation of the testing device, and, preferably, labeling at least one of the data range axes with standard deviation index units. The method further comprises obtaining data from a testing device to be analyzed and from a group of testing devices that operate over at least two ranges. Individual ranges for each of at least two ranges as well as group ranges and group standard deviations for at least two ranges are calculated from these test results. In the preferred embodiment, standard deviation indexes are computed for the testing device based on these calculations. The standard deviation indexes are plotted, and the resulting plot is preferably used to analyze the performance of and calibrate the testing device. Similarly, the graph of the invention comprises a graph with at least two generally parallel data range axes and a plot of deviation indexes for the testing device under analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile