The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1998

Filed:

Jul. 30, 1996
Applicant:
Inventor:

John C Yundt, Plano, TX (US);

Assignee:

Xyletech Systems, Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
36455101 ; 395140 ; 346 / ;
Abstract

A method is disclosed for analyzing the performance of a testing device for analyzing biochemical samples or human bodily fluids which operates over at least two ranges. The method of the present invention comprises obtaining a first set of test results relating to the biochemical samples from the testing device over at least two ranges, and calculating from the first set of test results an individual range mean for each of the at least two ranges. The method also includes obtaining a second set of test results relating to the biochemical samples from a group of testing devices that operate over the at least two ranges, calculating from the second set of test results a group range mean and a group range standard deviation for each of the at least two ranges, and calculating standard deviation indexes for the testing device from the individual range means, the group range means and the group range standard deviations. The method further comprises forming generally parallel spaced apart data range axes, each relating to a range of operation of the testing device, to facilitate analysis of the performance of the testing device over each range of operation, wherein the respective positions of the data range axes in relation to one another are scaled based on the values of the operating ranges, and then plotting all of the standard deviation indexes in relation to the data range axes in such a way that analysis of the performance of the testing device over the at least two operating ranges is provided in a single graphic display.


Find Patent Forward Citations

Yundt, John. (1998). Method of analyzing multiple range test data (U.S. Patent No. 5734591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5734591

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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