This inventor holds 2 USPTO granted patents. Top assignee: Tma Technologies, Inc.. Active years: 1993-1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1993-1995
Title: Innovations of John C. Stover
Introduction
John C. Stover is a notable inventor based in Bozeman, MT (US). He has made significant contributions to the field of optical measurement technology. With a total of 2 patents, Stover's work focuses on enhancing measurement accuracy and efficiency.
Latest Patents
Stover's latest patents include an "Apparatus and process for measuring gap and mismatch" and a "Modular scatterometer with interchangeable scanning heads." The first patent describes a hand-held apparatus designed to measure the gap and mismatch of two adjacent surfaces. This innovative device incorporates two strobe lights within a housing, directing light into parallel planes projected onto the surfaces. A camera captures the resulting image, and a signal processor calculates the gap and mismatch. The second patent presents an optical measurement device that utilizes Bidirectional Reflective Distribution Function (BRDF) techniques. This scatterometer is portable, relatively inexpensive, and features interchangeable scanning heads, allowing for versatile measurements across various applications and environmental conditions.
Career Highlights
Stover is currently associated with Tma Technologies, Inc., where he continues to develop cutting-edge technologies. His work has significantly impacted the field of optical measurements, providing solutions that were previously not feasible.
Collaborations
Stover has collaborated with notable coworkers, including Donald R. Bjork and Kelly H. Kirchner. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
John C. Stover's innovative patents and contributions to optical measurement technology highlight his role as a leading inventor in his field. His work continues to pave the way for advancements in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile