Company Filing History:
Years Active: 2002-2005
Title: John C Hay, Jr: Innovator in Measuring Physical Properties
Introduction
John C Hay, Jr. is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of measuring physical properties of matter, holding a total of 6 patents. His innovative approaches have advanced the understanding and measurement of various physical properties in different mediums.
Latest Patents
One of his latest patents is a method and apparatus for measuring the density of a sample while it is immersed in a gaseous medium with variable density. This invention includes a chamber for containing both the gaseous medium and the sample, along with mechanisms for varying the density of the gaseous medium. The apparatus features a balance beam with a sample pan and a coil assembly, which work together to maintain balance as the density changes. Another significant patent focuses on determining the relationship between hydrostatic stress and volumetric strain in compressible materials. This method involves varying the hydrostatic stress by changing the fluid medium's density and measuring the apparent weight changes of the sample.
Career Highlights
Throughout his career, John C Hay, Jr. has worked with several prominent companies, including Fast Forward Devices, LLC and IBM. His work in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in measurement technologies.
Collaborations
John has collaborated with notable individuals in his field, including Barry N Lucas and Jeffrey Curtis Hedrick. These partnerships have fostered a creative environment that has led to the development of groundbreaking inventions.
Conclusion
John C Hay, Jr. is a distinguished inventor whose work in measuring physical properties has made a lasting impact on the field. His innovative patents and collaborations highlight his commitment to advancing technology and understanding in this area.