The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Nov. 27, 2002
Applicant:
Inventors:
John C. Hay, Jr., Knoxville, TN (US);
Barry N. Lucas, Maryville, TN (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/36 ;
U.S. Cl.
CPC ...
G01N 9/36 ;
Abstract
The invention provides a method and apparatus for determining a relationship between hydrostatic stress and volumetric strain in a sample of compressible material, where the sample is immersed in a fluid medium having a density. The method includes steps of varying the hydrostatic stress on the sample by changing the density of the fluid medium over a range of densities, determining a change in apparent weight of the sample as the density of the fluid medium is changed, and determining the volumetric strain in the sample based on the change in apparent weight of the sample and the change in density of the fluid medium.