Gauting, Germany

Johannes Hopster

This inventor holds 1 USPTO granted patent. Top assignee: Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johannes Hopster. Retrieved from https://idiyas.com/inventor/johannes-hopster

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Johannes Hopster

Introduction

Johannes Hopster is a notable inventor based in Gauting, Germany. He has made significant contributions to the field of charged particle beam technology. His innovative work has led to the development of a unique beam separator device.

Latest Patents

Johannes Hopster holds a patent for a beam separator device, charged particle beam device, and methods of operating thereof. This device includes a first deflector that provides a magnetic deflection field for deflecting a charged particle beam along a beam entrance axis. The design incorporates multiple deflectors and rotation-free lenses to compensate for dispersion, enhancing the efficiency of charged particle beam manipulation.

Career Highlights

Hopster is associated with Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh, where he applies his expertise in semiconductor testing. His work has been instrumental in advancing technologies related to charged particle beams.

Collaborations

He has collaborated with notable colleagues such as Stefan Lanio and John Breuer, contributing to various projects in the field of semiconductor technology.

Conclusion

Johannes Hopster's innovative contributions to charged particle beam technology and his collaboration with industry professionals highlight his importance in the field. His patent for the beam separator device showcases his commitment to advancing technology in semiconductor testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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