Company Filing History:

22 out of 14,705

Infineon Technologies Ag

Years Active: 2003-2008

where 'Filed Patents' based on already Granted Patents

23 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 7428671 - Memory module with test structure (2008-09-23),

2. 7278072 - Method and auxiliary device for testing a RAM memory circuit (2007-10-02),

3. 7236412 - Integrated semiconductor memory with redundant memory cells replaceable for either true or complementary defective memory cells (2007-06-26),

4. 7135723 - Integrated circuit with a test circuit (2006-11-14),

5. 7123542 - Memory having internal column counter for compression test mode (2006-10-17),

6. 7068079 - Circuit device with clock pulse detection facility (2006-06-27),

7. 7064999 - Digital memory circuit having a plurality of memory banks (2006-06-20),

8. 6989707 - Semiconductor circuit and initialization method (2006-01-24),

9. 6986088 - Method and apparatus for reducing the current consumption of an electronic circuit (2006-01-10),

10. 6975131 - Integrated module having a delay element (2005-12-13),

11. 6961273 - RAM memory circuit having a plurality of banks and an auxiliary device for testing (2005-11-01),

12. 6937537 - Semiconductor memory with address decoding unit, and address loading method (2005-08-30),

13. 6928024 - RAM memory circuit and method for memory operation at a multiplied data rate (2005-08-09),

14. 6917563 - Integrated memory (2005-07-12),

15. 6917562 - Semi-conductor component with clock relaying device (2005-07-12),

Title: Innovations of Johann Pfeiffer: A Journey Through Memory Module Technologies

Introduction

Johann Pfeiffer, an accomplished inventor based in Ottobrunn, Germany, has made significant contributions to the field of memory technologies. With a robust portfolio of 23 patents, his work focuses on enhancing the efficiency and functionality of memory modules.

Latest Patents

Two of Johann Pfeiffer's latest patents exemplify his innovative spirit. The first patent, titled "Memory module with test structure," introduces a memory module featuring a unique memory cell configuration. This innovation includes a test structure with at least two test circuits configured in a distributed arrangement across the memory module, all interconnected through a common test switching bus. This system can connect to the address bus via a decoupling circuit during the testing operation, significantly improving the testing process for memory modules.

The second patent, titled "Method and auxiliary device for testing a RAM memory circuit," presents a sophisticated approach to testing RAM memory circuits. It allows for the selection of memory cell groups based on address information, enabling data to be written and read from groups of cells effectively. The method utilizes a test write cycle where multiple memory cell groups are selected, with data written simultaneously, followed by a read cycle that efficiently retrieves the data, producing compressed test results that indicate the integrity of the memory cells.

Career Highlights

Throughout his career, Johann Pfeiffer has collaborated with esteemed organizations such as Infineon Technologies AG and Qimonda AG. His experiences at these companies have played a crucial role in shaping his expertise and innovations in the memory technology sector.

Collaborations

Johann has worked alongside notable professionals like Helmut Fischer and Kazimierz Szczypinski. These collaborations have undoubtedly contributed to the innovative solutions he has developed in memory technology, fostering a culture of creativity and technical advancement.

Conclusion

Johann Pfeiffer's work defines the forefront of memory module innovations, making significant strides in memory testing methodologies and structures. His contributions not only enhance the capabilities of memory technologies but also pave the way for future advancements in the field. As technology continues to evolve, the impact of his patents will likely resonate within the industry for years to come.

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