This inventor holds 1 USPTO granted patent. Top assignee: Vistec Semiconductor Systems Gmbh. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Joerg Lenz: Innovator in Interferometric Measurement Technology
Introduction
Joerg Lenz is a notable inventor based in Biebertal, Germany. He has made significant contributions to the field of measurement technology, particularly through his innovative patent in interferometric devices. His work has implications for precision measurement in various applications.
Latest Patents
Joerg Lenz holds a patent for an "Interferometric device for position measurement and coordinate measuring machine." This device utilizes a laser light source to measure the position of a moveable element in a plane. The device features a beam splitter that divides the measuring light into two partial beam paths, which interact with the reflecting surface of the moveable element via an interferometer. Additionally, the design includes beam traps associated with the beam splitters to capture light returning from the interferometers, enhancing measurement accuracy. He has 1 patent to his name.
Career Highlights
Lenz is currently employed at Vistec Semiconductor Systems GmbH, where he continues to develop and refine measurement technologies. His expertise in interferometry has positioned him as a key player in the advancement of precision measurement systems.
Collaborations
Throughout his career, Joerg Lenz has collaborated with esteemed colleagues such as Hans-Artur Boesser and Siegfried Peter Kluge. These partnerships have fostered innovation and contributed to the development of cutting-edge measurement solutions.
Conclusion
Joerg Lenz's contributions to interferometric measurement technology exemplify his commitment to innovation in the field. His patent and ongoing work at Vistec Semiconductor Systems GmbH highlight his role as a significant inventor in precision measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile