Nampa, ID, United States of America

Joe Lee Phillips

This inventor holds 11 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 1999-2006.


% Patents Active = 54.5

Average Co-Inventor Count = 4.0

ph-index = 6

Forward Citations = 57(Granted Patents)


Company Filing History:


Years Active: 1999-2006

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11 patents (USPTO):Explore Patents

Title: Innovations of Joe Lee Phillips

Introduction

Joe Lee Phillips is a notable inventor based in Nampa, ID (US), recognized for his contributions to the field of semiconductor technology. With a total of 11 patents to his name, Phillips has made significant advancements that enhance the efficiency and effectiveness of material detection and wafer inspection processes.

Latest Patents

Among his latest innovations is the "Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light." This invention provides a method for detecting specific materials, such as photo-resist material, on sample surfaces. The process involves projecting a narrow beam of light onto the sample surface and measuring the fluoresced and/or reflected light intensity at a specific wavelength band. The light intensity is then converted into a numerical value and transmitted to a logic circuit, which determines the appropriate handling of the sample. This method is particularly beneficial for detecting photo-resist material on semiconductor wafers.

Another significant patent is the "Rotating gripper wafer flipper," which offers a method for inspecting semiconductor wafers. This invention features an arm designed to hold a wafer, mounted on a rotational device. This allows users to inspect the wafer in any position without physically touching it or moving it to another inspection station. The arm can rotate about an axis parallel to the wafer's surface and another axis perpendicular to it, providing comprehensive inspection capabilities.

Career Highlights

Joe Lee Phillips is currently employed at Micron Technology Incorporated, where he continues to innovate and develop new technologies in the semiconductor industry. His work has been instrumental in advancing the methods used for material detection and wafer inspection.

Collaborations

Phillips has collaborated with notable colleagues, including David R Johnson and Peter S Frank, contributing to a dynamic and innovative work environment.

Conclusion

Joe Lee Phillips stands out as a significant figure in the field of semiconductor technology, with a strong portfolio of patents that reflect his innovative spirit and dedication to advancing industry standards. His contributions continue to shape the future of material detection and wafer inspection processes.

Profile summary based on public USPTO records.
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