Campbell, CA, United States of America

Jocelyn Blair

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: D2s, Inc.. Active years: 2025.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jocelyn Blair

Introduction

Jocelyn Blair is a prominent inventor based in Campbell, California. She has made significant strides in the field of computational metrology and inspection. Her work focuses on enhancing manufacturing processes through innovative methods.

Latest Patents

Jocelyn holds a patent for a "Method for computational metrology and inspection for patterns to be manufactured on a substrate." This patent involves generating a scanner aerial image using a neural network. The process includes utilizing a mask inspection image produced by a mask inspection machine. Additionally, her method encompasses training the neural network with various images, such as simulated scanner aerial images and other selected images from different inspection techniques.

Career Highlights

Jocelyn is currently employed at D2S, Inc., where she continues to develop cutting-edge technologies. Her expertise in computational methods has positioned her as a valuable asset in her field. She has demonstrated a commitment to advancing the capabilities of manufacturing processes through her innovative approaches.

Collaborations

Jocelyn collaborates with talented individuals such as Linyong Pang and Ajay Baranwal. Their teamwork fosters an environment of creativity and innovation, leading to groundbreaking advancements in their projects.

Conclusion

Jocelyn Blair's contributions to the field of computational metrology and inspection exemplify her dedication to innovation. Her patent and collaborative efforts highlight her role as a leading inventor in her industry.

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