Jiuan Lai

Title: Jiuan Lai - Innovator in Semiconductor Testing Tools

Introduction

Jiuan Lai is a notable inventor based in Chang-Hua Hsiang, Taiwan. He has made significant contributions to the field of semiconductor testing, particularly with his innovative tools designed for positioning semiconductor chip test probes. His work has been instrumental in enhancing the efficiency and accuracy of semiconductor testing processes.

Latest Patents

Jiuan Lai holds a patent for "Tools for positioning semiconductor chip test probes." This invention pertains to semiconductor test equipment, where test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer. The adjustment tool he developed comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. Notably, the tool is preferably formed of used test probes made of tungsten and is plated with a titanium nitride layer to increase its lifespan.

Career Highlights

Throughout his career, Jiuan Lai has worked with several companies, including Promos Technologies, Inc. and Mosvel Vitelic Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in semiconductor technology.

Collaborations

Jiuan Lai has collaborated with several professionals in his field, including Cindy Chen and Liza Chen. Their teamwork has fostered innovation and development in semiconductor testing tools.

Conclusion

Jiuan Lai's contributions to semiconductor testing through his patented tools demonstrate his commitment to innovation in the technology sector. His work continues to influence the efficiency of semiconductor testing processes.