The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2000
Filed:
Nov. 25, 1998
Applicant:
Inventors:
Cindy Chen, Hsin-Chuang, TW;
Liza Chen, Hsinchu, TW;
Jiuan Lai, Chang-Hua Hsiang, TW;
Jessie Chang, Hsinchu, TW;
Kelly Liao, Tao-Yuan Hsiang, TW;
Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J / ; G01R / ;
U.S. Cl.
CPC ...
294-11 ; 294902 ;
Abstract
In a semiconductor test equipment, in which test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer, an adjustment tool for adjusting the position of the test probes is disclosed. The adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. The tool is preferably formed of used test probes comprised of tungsten. The tool is plated with a titanium nitride layer to increase the life of the tool.