Jessie Chang

Title: Innovations by Jessie Chang in Semiconductor Testing

Introduction

Jessie Chang is a notable inventor based in Hsinchu, Taiwan. She has made significant contributions to the field of semiconductor testing, particularly with her innovative tools designed for positioning semiconductor chip test probes. Her work has been instrumental in enhancing the efficiency and accuracy of semiconductor testing processes.

Latest Patents

Jessie Chang holds a patent for her invention titled "Tools for positioning semiconductor chip test probes." This invention addresses the challenges faced in semiconductor test equipment, where test probes must make contact with bonding pads of semiconductor chips on a wafer. The adjustment tool she developed features a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. Notably, the tool is constructed from used tungsten test probes and is plated with a titanium nitride layer to extend its lifespan.

Career Highlights

Throughout her career, Jessie has worked with prominent companies in the semiconductor industry, including Promos Technologies, Inc. and Mosvel Vitelic Inc. Her experience in these organizations has allowed her to refine her skills and contribute to advancements in semiconductor technology.

Collaborations

Jessie has collaborated with talented individuals such as Cindy Chen and Liza Chen. These partnerships have fostered a creative environment that has led to innovative solutions in semiconductor testing.

Conclusion

Jessie Chang's contributions to semiconductor testing through her innovative tools and collaborations highlight her importance in the field. Her patent and career achievements reflect her dedication to advancing technology in the semiconductor industry.