Tokyo, Japan

Jinji Tokita

This inventor holds 1 USPTO granted patent. Top assignee: Adv Antest Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinji Tokita. Retrieved from https://idiyas.com/inventor/jinji-tokita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Jinji Tokita: Innovator in Electronic Device Testing

Introduction

Jinji Tokita is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of electronic device test apparatuses.

Latest Patents

Jinji Tokita holds a patent for a "Calibration method of electronic device test apparatus." This invention utilizes image processing technology to accurately position an integrated circuit (IC) device relative to a socket. The method involves calculating an offset amount of a socket guide based on the relative positions of the socket camera and the socket guide. This offset is then added to the device camera's relative position to ensure precise alignment with the socket.

Career Highlights

Jinji Tokita is currently employed at Adv Antest Corporation, where he continues to develop and refine testing technologies. His expertise in calibration methods has positioned him as a key player in the advancement of electronic testing solutions.

Collaborations

Throughout his career, Jinji has collaborated with talented individuals such as Aritomo Kikuchi and Hiroto Nakamura. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Jinji Tokita's contributions to electronic device testing through his innovative patent demonstrate his commitment to advancing technology in this field. His work continues to influence the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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