The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Dec. 11, 2006
Applicants:

Aritomo Kikuchi, Tokyo, JP;

Hiroto Nakamura, Tokyo, JP;

Jinji Tokita, Tokyo, JP;

Katsuhiko Ikeda, Tokyo, JP;

Inventors:

Aritomo Kikuchi, Tokyo, JP;

Hiroto Nakamura, Tokyo, JP;

Jinji Tokita, Tokyo, JP;

Katsuhiko Ikeda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.


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