Changzhou, China

Jindong Cui

USPTO Granted Patents = 2 

 

Average Co-Inventor Count = 6.2

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):

Title: Innovations and Contributions of Inventor Jindong Cui

Introduction

Jindong Cui is a notable inventor based in Changzhou, China, recognized for his contributions to the field of precision measurement technology. His innovative approach to addressing challenges in checkweighing devices has led to the development of a significant patent. As a professional, he has honed his skills while working at prominent companies in the industry.

Latest Patents

Jindong Cui holds a patent titled "Method and System for Measuring Interference in a Checkweighing Device." This patent presents a method and system to measure the interference influences on a checkweighing device. The method involves obtaining external interference data, alongside interference data from the checkweighing device itself and the object being weighed. By calculating or mapping weighing error data in different operational states, the system effectively measures interference. This innovation facilitates the production, debugging, maintenance, and overall use of checkweighing devices, thus enhancing their efficiency and accuracy.

Career Highlights

Cui’s career includes work with Mettler-Toledo (Changzhou) Precision Instruments Ltd. and Mettler Toledo (Changzhou) Measurement Technology Ltd., where he has contributed significantly to the development of precision instruments. His expertise in measurability and error reduction has established him as a key player in his field.

Collaborations

Throughout his career, Jindong Cui has collaborated with talented professionals such as Shenhui Wang and Huifang Wu. These collaborations have enriched the innovation process, allowing for a diverse exchange of ideas and advancements in technologies used in precision measurement.

Conclusion

Jindong Cui's contributions to the world of innovations, particularly in the realm of checkweighing devices, exemplify the impact of dedicated inventors in enhancing technological capabilities. His patented methods signify a step forward in addressing interference challenges, ultimately leading to improved performance in measurement technologies.

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