The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jul. 29, 2020
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Song Zhang, Changzhou, CN;
Shenhui Wang, Changzhou, CN;
Shenjian Qian, Changzhou, CN;
Jindong Cui, Changzhou, CN;
Gang Yang, Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A weighing method comprises the steps of: recognizing one or more objects to be detected on a first scale platform top (A) or within an object recognition area of the first scale platform top (A), and weighing the objects to be detected that are placed on a second scale platform top (B). A weighing system comprises at least two scales having scale platform tops utilizing the weighing method outlined above. The weighing method reduces the difficulty of algorithm recognition by increasing the degree to which the object on the weighting platform fits the algorithm, reduces the complexity of operation flow and the time required, and effectively increases the precision and accuracy of object recognition.